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Introduction
The resistivity measurements of semiconductors cannot reveal whether one or two types of carriers are present; nor distinguish between them. However, this information can be obtained from Hall Coefficient measurements, which are also basic tools for the determination of carrier density and mobility in conjunctions with resistivity measurement.

Working
When a conductor through which current is flowing, is placed in the magnetic field, a potential difference is generated between two opposite edges of the conductor in the direction mutually perpendicular to both the field and the conductor. This potential developed is Hall voltage and the phenomenon is called Hall Effect. In the experimental setup, the crystal mounted on PCB is placed perpendicular to the pole pieces. A constant current is passed through the crystal using the constant current source. Magnetic field is produced by electromagnet operated by 0 – 12 V DC, 5 A power supply. Magnetic field intensity is measured by gauss meter with gauss probe. A Hall voltage thus produced is measured by the multimeter.

The following parts are included in Hall Effect Experiment:
PH93225H Hall Probe
PH61033D/5 Advanced Power Supply
PH93225E Electromagnet Setup
PH61500 Constant Current Power Supply
PH93225G Digital Gauss Meter
PH64505 3½ Digit Multimeter